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Wafer Electrical Test Data and SPICE Model Parameters On Semi C5 (0.50 micron) Unless otherwise indicated, designs in this technology were fabricated on epitaxial wafers. SPICE Corner Parameters T9BM T9CR T99J T97T T97G T97R T95S T93X_C5F_NON_EPI T93X_C5F_EPI T5AV_#2_C5N T91T T8CG T89C T8BY T89Y T89Z T88K T86S T85R T86J T85Z T84F_C5T T84F_C5N T82Q T7AC T81A T77X T7CU T78M T77Z T76D T74S T73G T72U T71F T6BJ T6AU T69K T68Z T66H T62R T61F T5CX T5BK T5AR T59J T58Y T56H T55W T54G T52C T53Q T51T T51A T4AA T21R T4BP T49M T48X T47F T46T T44L T43A T42Q T42T T41C T41J T3CU T3AJ T3AF T39U T38O T37D T36S T36R T35H T33A T32T T31H T31K T2CT T2AK T29Y T28O T27I T26B T26Y T25Q T24O T24H T22A T22Y T21S T1CK T19L T1BD T1AW T17G T17Z T16W T15O T15M T15F T15D T13V T13R T11F T11Z T11W T0CP T0BI T09W T07O T05C T06F T02C T03M T01X Go to On Semi C5 Fabrication Process Related Links Fabrication Schedule Customer Support MOSIS Products

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