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General Information About MOSIS Products Processes Prices Support User Group Events Job Openings News Work with MOSIS Getting Started Design and Test Requests Run Status Project Status Test Data Docs and Forms Documents Forms/Agreements Web Forms Quick Reference New Users Experienced Users Purchasing Agents Design and Test Academic Institutions Export Program Submit A Project Search MOSIS	Wafer Electrical Test Data and SPICE Model Parameters for Classroom Instructional Purposes These SPICE level 3 model parameters are for classroom instructional purposes, not for actual IC design work. Lot-specific parametric results and SPICE device model parameters extracted from measurements on wafers probed at MOSIS are also available. AMI C5 0.50 micron Agilent/HP 0.50 micron (AMOS14TB) TSMC 0.25 micron TSMC 0.35 micron Related Links SPICE Parameters for Submicron Technologies (MOSIS perspectives) MOSIS Process Monitor (used for test data measurements)
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