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Wafer Electrical Test Data and SPICE Model Parameters for Classroom Instructional Purposes These SPICE level 3 model parameters are for classroom instructional purposes, not for actual IC design work. Lot-specific parametric results and SPICE device model parameters extracted from measurements on wafers probed at MOSIS are also available. AMI C5 0.50 micron Agilent/HP 0.50 micron (AMOS14TB) TSMC 0.25 micron TSMC 0.35 micron Related Links SPICE Parameters for Submicron Technologies (MOSIS perspectives) MOSIS Process Monitor (used for test data measurements)

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