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An introduction to working with the MOSIS Integrated Circuit Fabrication Service for test engineers. MOSIS Resources For Test Engineers Wafer Electrical Test Data and SPICE Model Parameters Lot-specific parametric results and SPICE device model parameters extracted from measurements on wafers probed by MOSIS. SPICE Parameters for Submicron Technologies MOSIS perspectives on obtaining lot-specific parametrics extracted from wafers probed by MOSIS. MOSIS Process Monitor The MOSIS Process Monitor (PM) consists of test devices for monitoring fabrication of wafers by MOSIS foundries. SPICE Model Parameters FAQ Frequently asked questions about Spice model parameters. See also Reference Guides For: New MOSIS Customers Educational Program at MOSIS Purchasing Agents

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