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An introduction to working with the MOSIS Integrated Circuit Fabrication Service for test engineers.
MOSIS Resources For Test Engineers
Wafer Electrical Test Data and SPICE Model Parameters
Lot-specific parametric results and SPICE device model parameters extracted from measurements on wafers probed by MOSIS.
SPICE Parameters for Submicron Technologies
MOSIS perspectives on obtaining lot-specific parametrics extracted from wafers probed by MOSIS.
MOSIS Process Monitor
The MOSIS Process Monitor (PM) consists of test devices for monitoring fabrication of wafers by MOSIS foundries.
SPICE Model Parameters FAQ
Frequently asked questions about Spice model parameters.
See also Reference Guides For:
New MOSIS Customers
Educational Program at MOSIS
Purchasing Agents
The MOSIS Service
4676 Admiralty Way, Marina del Rey, California 90292-6695 USA
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