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IBM 9SF CMOS Process
90 Nanometer (90 nm)


If your design will be used for production, i.e. non-MPW, please read the IBM policy described in "Checking and Error Disposition Strategy for IBM Designs."


  1. Process Description
    MOSIS is offering access to the IBM 90 nm CMOS 9SF technology for prototype and low volume fabrication. C4 (IBM's flip chip bumping) is subject to availability at additional cost. Advance notice required: contact support@mosis.com.

    MOSIS offers this CMOS process as 8 metal layers (M1, M2, M3, M4, M5, M6, M1_2B, M2_2B) plus LB (transfer) to DV (glass cut). This is the IBM "6_02_00" stack, with six thin metals over low-K dielectric, two thick metals ("2x") over TEOS/FTEOS dielectric, and no "4x" metals. Supply voltages are 1.0 V core and 2.5 V I/O.

    9SF Supported Options
    Please refer to the List of 9SF Supported Options page for the options available on MOSIS MPW runs in this technology. You may not submit a design containing any options or metals stack which are not listed here without prior arrangement with MOSIS. Other configurations are available for dedicated runs.

    Design Considerations
    To insure that submitted data is on a 5 nm grid, please stream-out at 1 DBU = 5 nm (Cadence 0.005, not 0.001).
    MOSIS does not fill for IBM processes. Designs for IBM runs must meet the IBM fill requirements when submitted.


  2. IBM Design Rules, Process Specifications, SPICE Parameters, and Cell Libraries
    IBM has sub-licensed MOSIS to distribute this information to customers who have signed both the MOSIS customer agreement and the IBM Design Kit License Agreement.

    The CAD tool support files, DRC and LVS decks, simulation files, cell libraries, and files listed on the IBM CMOS Design Kits page are the only kits and files available.

    Design rules supported by this technology
    Only the IBM design rules will be supported for this technology.

    MOSIS Technology Codes
    The technology code for the 9SF process is IBM_9SF.

  3. Parametric Test Results and SPICE Model Parameters
    See Test Results for IBM 90 nanometer runs.


  4. Reticle/Wafer Size, Steps, Turnaround Time, Die and Wafer Thickness

    IBM CMOS
    90 Nanometer
    9SF Process
    Wafer Size
    (inches)
    Reticle Size (milli- meters, approx.) Reticle Copies Stepped on Wafer (approx.) Turn- around Time* Die Thickness
    (+/- .5 mil)
    Bumped Die Thickness **
    (+/- .5 mil)
    Wafer Thickness
    Mils Micro- meters Mils Micro- meters Mils Micro- meters
    8 18 x 20 60 57 10 250 10 250 30 760
      * Calendar days from release to manufacturing. Does not include dicing/packaging/backlapping (for planning purposes only).

    ** Die thickness only. Does not include height of the bumps.
        To order a special bumped die thickness, describe your requirements in the SPECIAL-HANDLING parameter of your New Project, Fabrication, or Update Request.



Related Links
  • MOSIS-Supported IBM Processes
  • IBM Technology Codes & Layer Maps
  • IBM Document Access



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