IBM > IBM Test Results
Wafer Electrical Test Data and SPICE Model Parameters
V18C_5HPE_4M
V16R_5PAE_4M
V04A_5PAE_4M
V02E_5HPE_4M_QT
V02E_5HPE_4M_QX
V01P_5PAE_4M
T9AQ_5HPE_4M_QT
T9AQ_5HPE_4M_QX
T8BD_5PAE_4M
T91S_5HPE_6M
T91S_5HPE_4M
T83Z_5HPE_4LM_1
T83Z_5HPE_4LM
T87W_5HPE_6M
T86U_5PAE_4M
T84K_5HPE_4LM
T81C_5HPE_QT
T81C_5HPE_QX
T7BJ_5HPE_6LM
T7BJ_5HPE_4LM
T78H_5HPE_4LM
T75W_5HPE_4LM
T71J_5HPE_6LM
T71J_5HPE_4LM
T6AP_5HPE_4LM
T68X_5HPE_6LM
T5AT
T52Z
T4AY
T47H
T44F
T44F_5HPE_3M
T42O
T3BL
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