MOSIS Resources For Test Engineers

An introduction to working with the MOSIS Integrated Circuit Fabrication Service for test engineers.

Lot-specific parametric results and SPICE device model parameters extracted from measurements on wafers probed by MOSIS.

MOSIS perspectives on obtaining lot-specific parametrics extracted from wafers probed by MOSIS.

The MOSIS Process Monitor (PM) consists of test devices for monitoring fabrication of wafers by MOSIS foundries.

Frequently asked questions about Spice model parameters.