Products > IC Fabrication
Design Flows, Design Kits and Design Rules.
Multi-Project Wafer Fabrication Schedule
Fabrication Processes Available through MOSIS
MOSIS Process Control Monitor
The MOSIS Process Control Monitor (PCM) is included on selected MOSIS runs. Lot-specific parametric results and SPICE device model parameters are extracted from PCM measurements on wafers probed by MOSIS.